Materials engineers don't like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical materials. So, as a ...

Within the body of a high-voltage multi-layer ceramic capacitor, a gap-type defect is beginning its career of destruction. The defect may be a void within the ceramic dielectric, a crack within the ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Silicon carbide after irradiation, in which loose carbon atoms (green) move toward the boundary (dashed line) between grains of the crystalline ceramic. Courtesy: Hongliang Zhang Grain boundaries in ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...

AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...