Tech Xplore on MSN
Flawed chip reliability tests may misjudge insulators' lifetimes, new method suggests
Microelectronics is currently undergoing major changes: The industry is working on promising new materials and chip ...
Researchers have developed a statistical method that could improve the prediction of semiconductor insulator lifetimes and ...
Microelectronics is currently undergoing major changes: the industry is working on promising new materials and chip architectures. But this also means ...
The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results